Deposition and physical properties of Cu6PS5I-based thin films

Issue 40, 2016

I.P. Studenyak, V.Yu. Izai, A.V. Bendak, M.M. Kutsyk, P.P. Guranich, P. Kúš, M. Mikula, B. Grančič,

10.24144/2415-8038.2016.40.72-79

Abstract

Cu6PS5I-based thin films were deposited onto silicate glass substrates by non-reactive radio frequency magnetron sputtering. The chemical composition of thin films were determined by energy-dispersive X-ray spectroscopy. Electrical conductivity of Cu6PS5I-based thin films was studied depends on chemical composition. Optical transmission spectra of Cu6PS5I-based thin films were investigated in the interval of temperatures 77-300 K. Absorption edge spectra and refractive index dispersion were derived from the optical transmission spectra. The variation of the main parameters of Urbach absorption edge and electron-phonon interaction was analysed depends on Cu content in Cu6PS5I-based thin films

Keywords: thin film, magnetron sputtering, electrical conductivity, optical absorption, refractive index

Suggested citation

I.P. Studenyak, V.Yu. Izai, A.V. Bendak, M.M. Kutsyk, P.P. Guranich, P. Kúš, M. Mikula, B. Grančič, & T. Roch (2016).

Deposition and physical properties of Cu6PS5I-based thin films

. Scientific Herald of Uzhhorod University. Series "Physics", (40), 72-79. 10.24144/2415-8038.2016.40.72-79
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