Abstract

The possibility of using the methods of X-ray photoelectron spectroscopy and photoelectron spectroscopy using synchrotron radiation was analyzed to study the structure of non-crystalline semiconductor materials, including chalcogenides. Advantages and disadvantages of these methods in case of studies of thin layers or surface of chalcogenide glasses were discovered

Keywords: X-ray photoelectron spectroscopy (XPS), photoelectron spectroscopy using synchrotron radiation (SRPES), amorphous chalcogenides, structural units

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