Near-threshold excitation of the λ132.2 nm resonance line of the Tl+ ion by electron impact A.N. Gomonai , V.I. Roman , L.O. Banduryna , A.I. Gomonai , V.V. Zvenihorodsky , Yu.I. Hytych https://doi.org/10.24144/2415-8038.2018.44.126-135 Keywords: ion, electron, dielectronic recombination, thallium Read more